Designing, Simulation and Fabrication of a Wideband Sampling Antenna with Dual Polarization

Document Type : -

Authors

1 Master's degree, Malek-Ashtar University of Technology , Tehran, Iran

2 Associate Professor, Malek-Ashtar University of Technology, Tehran, Iran

3 Researcher, Malek-Ashtar University of Technology. Tehran, Iran

Abstract

In this article, based on the principles and theoretical studies governing sampling antennas for near field measurement, a dual polarization broad band sampling antenna has been designed, simulated and fabricated. The sampling antenna design is such that first a power combiner has been designed to neutralize the TEM mode by defining a phase difference of zero and 180 degrees between two input ports. Then, the effect of the presence of matching loads and side bends in the sampling antenna has been evaluated. Finally, the use of side bends due to the presence of the power divider has caused the wave to radiate twice, once in the main lobe and once in the sidelobes which it has increased the gain, sidelobe level and cross polarization in the sampling antenna. The sampling antenna chosen has been fabricated in the X frequency band by placing two waveguide adapters in the reverse direction with each other to create a 180 degree phase difference. The fabricated antenna has two orthogonal linear polarizations. The results indicate that the cross polarization level is low and the return loss is below -10 dB for each port.

Highlights

[1]      Balanis, C. A.  “Antenna Theory : Analysis and Design”; JOHN WILEY & SONS, Canada,2005.

   [2]      Slater ,D. “Near-field antenna measurement techniques”; Artech House. Boston, 1990.

   [3]      A. D. Yaghjian. “An overview of near-field antenna measurements”; IEEE Transactions on antennas and propagation, vol. 34, no. 1, pp. 30-45, 1986.

   [4]      Chamani, S.; Nasari, S. “Applying MLPSO algorithm in the computations of planar near-field antenna measurement”;  Journal of Applied Electromagnetic.  vol. 1, no. 1, pp. 19-26, 2013. (In persian). Dor:20.1001.1.26455153.1392.1.1.3.4

 

   [5]      Ferrara, F. ; Gennarelli, C. ; Guerriero, R. “Near-Field Antenna Measurement”; Handbook of Antenna Technologies. Springer, Singapore(2016). Doi: 10.1007./978-981-4560-44-3_117.

 

   [6]      M. A. Moutaouekkil, Ch. Taybi and A. Ziyyat, “Probes characterization for antennas near field measurement”; Conference: IEEE 14th Mediterranean Microwave Symposium (MMS),2014,  Doi:10.1109/MMS.2014.7088986

 

   [7]      Kalashnikov.;  Vadim Serafimovich, et al. “Near-Field Antenna Measurements, Calculations and Facility Design”;  Springer Singapore, 2021. Doi:10.1007/978-981-33-6436-3

 

  [8]      “IEEE Recommended Practice for Near-Field Antenna Measurements ”; in IEEE Std 1720-2012 , vol, no, pp. 1-102, 5 Dec. 2012, doi: 10.1109/IEEESTD.2012.6375745.

 

  [9]      Gregson, S.; McCormick, J.; and Parini, C. “Principles of planar near-field antenna measurements ”; IET, January 2007 

Doi:10.1049/PBEW053E

 

[10]      Glisson, A. “Spherical near-field antenna measurements, edited by J.E. Hansen ”; in IEEE Antennas and Propagation Society Newsletter, vol. 31, no. 3, pp. 35-36, June 1989 Doi: 10.1109/MAP.1989.6102052

 

[11]      Tayebi, A .; Gomez Perez,J .; E. Garcia, I .; Gonzalez Diego and Catedra Perez M. F. “Optimized Design of a Compact Probe for Accurate Near Field Measurements ”; in IEEE Transactions on Antennas and Propagation, vol. 59, no. 6, pp. 2429-2433, June 2011,  Doi: 10.1109/TAP.2011.2143659.

 

[12]      “IEEE Standards Test Procedure for Antennas, IEEE Standard”; 149-1955 (ANSI C16.11-1971), Apr. 1955, pp. 1–29, Doi: 10.1109/IEEESTD.1965.7368066.

 

[13]      Foged, L. J .; Giacomini, A .; and Morbidini. R. “Dual polarized probe for wideband planar near field measurement applications”; Proceedings of the 5th European Conference on Antennas and Propagation (EUCAP). IEEE, 2011. 

 

[14]      Kim ,O. S .; Pivnenko, S.; and Breinbjerg, O. “Wideband scalable probe for Spherical Near-Field Antenna measurements”;  Proceedings of the 5th European Conference on Antennas and Propagation (EUCAP), Rome, Italy, 2011, pp. 1781-1785.

 

[15]      Foged, L. J .; et al. “Dual polarized near field probe based on OMJ in waveguide technology achieving more than octave bandwidth”; AMTA 2014. 

 

[16]            Foged, L. J .; Giacomini, A.; and Morbidini. R.; Tancioni, L.;  Estrada, J.; Acree, J. “Minimum Scattering Probe for High Accuracy Planar NF Measurements”; AMTA 2016, Oct. 30 – Nov. Doi:10.23919/AMTAP.2017.8123716

[17]      Wittmann.; Ronald C.; Michael H. Francis. “Near-Field Spherical Scanning Antenna Measurements: Probe Deconvolution and Sensitivity”; International Journal of Antennas and Propagation 2014.

[18]      Volakis, J. “Antenna Engineering Handbook Fourth Edition”; US: McGraw-Hill Professional, 2007.

 

Keywords

Main Subjects

References

[1]      Balanis, C. A.  “Antenna Theory : Analysis and Design”; JOHN WILEY & SONS, Canada,2005.
   [2]      Slater ,D. “Near-field antenna measurement techniques”; Artech House. Boston, 1990.
   [3]      A. D. Yaghjian. “An overview of near-field antenna measurements”; IEEE Transactions on antennas and propagation, vol. 34, no. 1, pp. 30-45, 1986.
   [4]      Chamani, S.; Nasari, S. “Applying MLPSO algorithm in the computations of planar near-field antenna measurement”;  Journal of Applied Electromagnetic.  vol. 1, no. 1, pp. 19-26, 2013. (In persian). Dor:20.1001.1.26455153.1392.1.1.3.4
   [5]      Ferrara, F. ; Gennarelli, C. ; Guerriero, R. “Near-Field Antenna Measurement”; Handbook of Antenna Technologies. Springer, Singapore(2016). Doi: 10.1007./978-981-4560-44-3_117.
 
   [6]      M. A. Moutaouekkil, Ch. Taybi and A. Ziyyat, “Probes characterization for antennas near field measurement”; Conference: IEEE 14th Mediterranean Microwave Symposium (MMS),2014,  Doi:10.1109/MMS.2014.7088986
 
   [7]      Kalashnikov.;  Vadim Serafimovich, et al. “Near-Field Antenna Measurements, Calculations and Facility Design”;  Springer Singapore, 2021. Doi:10.1007/978-981-33-6436-3
 
  [8]      “IEEE Recommended Practice for Near-Field Antenna Measurements ”; in IEEE Std 1720-2012 , vol, no, pp. 1-102, 5 Dec. 2012, doi: 10.1109/IEEESTD.2012.6375745.
 
  [9]      Gregson, S.; McCormick, J.; and Parini, C. “Principles of planar near-field antenna measurements ”; IET, January 2007 
Doi:10.1049/PBEW053E
 
[10]      Glisson, A. “Spherical near-field antenna measurements, edited by J.E. Hansen ”; in IEEE Antennas and Propagation Society Newsletter, vol. 31, no. 3, pp. 35-36, June 1989 Doi: 10.1109/MAP.1989.6102052
 
[11]      Tayebi, A .; Gomez Perez,J .; E. Garcia, I .; Gonzalez Diego and Catedra Perez M. F. “Optimized Design of a Compact Probe for Accurate Near Field Measurements ”; in IEEE Transactions on Antennas and Propagation, vol. 59, no. 6, pp. 2429-2433, June 2011,  Doi: 10.1109/TAP.2011.2143659.
 
[12]      “IEEE Standards Test Procedure for Antennas, IEEE Standard”; 149-1955 (ANSI C16.11-1971), Apr. 1955, pp. 1–29, Doi: 10.1109/IEEESTD.1965.7368066.
 
[13]      Foged, L. J .; Giacomini, A .; and Morbidini. R. “Dual polarized probe for wideband planar near field measurement applications”; Proceedings of the 5th European Conference on Antennas and Propagation (EUCAP). IEEE, 2011. 
 
[14]      Kim ,O. S .; Pivnenko, S.; and Breinbjerg, O. “Wideband scalable probe for Spherical Near-Field Antenna measurements”;  Proceedings of the 5th European Conference on Antennas and Propagation (EUCAP), Rome, Italy, 2011, pp. 1781-1785.
 
[15]      Foged, L. J .; et al. “Dual polarized near field probe based on OMJ in waveguide technology achieving more than octave bandwidth”; AMTA 2014. 
 
[16]            Foged, L. J .; Giacomini, A.; and Morbidini. R.; Tancioni, L.;  Estrada, J.; Acree, J. “Minimum Scattering Probe for High Accuracy Planar NF Measurements”; AMTA 2016, Oct. 30 – Nov. Doi:10.23919/AMTAP.2017.8123716
[17]      Wittmann.; Ronald C.; Michael H. Francis. “Near-Field Spherical Scanning Antenna Measurements: Probe Deconvolution and Sensitivity”; International Journal of Antennas and Propagation 2014.
[18]      Volakis, J. “Antenna Engineering Handbook Fourth Edition”; US: McGraw-Hill Professional, 2007.
 
Journal of Advanced Defense Science & Technology
Volume 15, Issue 2 - Serial Number 56
Summer
September 2024
Pages 95-106

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History

  • Receive Date: 05 May 2024
  • Revise Date: 06 July 2024
  • Accept Date: 02 August 2024
  • Publish Date: 22 August 2024

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